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originally published in 1992
SEMI MF1724 — Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy
This Test Method applies to gas source equipment used in semiconductor manufacturing facilities and comparable research and development areas
本仕様が意図しているものは，電子材料グレード単結晶シリコンインゴット成長のために用いられる多結晶シリコンの調達に使用することである。そのようなインゴットは，ウェーハに切断され，その後，半導体デバイス，集積回路，マイクロエレクトロメカニカルシステム（MEMS）を含む他のマイクロエレクトロニック部品の製造に使用される。
SEMI E162 — Mechanical Interface Specification for 450 mm Front-Opening Shipping Box Load Port
G02800 - SEMI G28 - Specification for Leadframes for Plastic Molded S.O. Packages StdTpc-FPD Masks originally published in 1992This Standard was technically approved by the global Assembly & Packaging Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on July 1, 2011. Available at www. semiviews. org and www. semi. org in August 2011; originally published in 1986; previously published September 1997. This Specification defines the acceptance criteria for stamped leadframes for plastic molded S. O. packages. Referenced
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